Pediatric Allergic Contact Dermatitis: Sensitization Patterns for a Practical Panel
Acta Cytologica, ss.1-7, 2026 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Basım Tarihi: 2026
- Doi Numarası: 10.1159/000552351
- Dergi Adı: Acta Cytologica
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, CINAHL, EMBASE, MEDLINE
- Sayfa Sayıları: ss.1-7
- Anahtar Kelimeler: Contact dermatitis, Children, Atopy patch test
- Sağlık Bilimleri Üniversitesi Adresli: Evet
Özet
Introduction: Allergic contact dermatitis (ACD) is increasingly recognized in the pediatric population. Although patch testing is the gold standard for diagnosis, the absence of standardized, evidence-based pediatric patch test panels and limited access to comprehensive allergen series in many settings pose significant diagnostic challenges. This study aimed to evaluate a practical and shortened patch test panel suitable for children with ACD. Methods: The clinical characteristics and patch test results of pediatric patients diagnosed with ACD between 2017 and 2021 were retrospectively analyzed. Patch testing was performed using the Thin-Layer Rapid-Use Epicutaneous (T.R.U.E.) Test, and allergen positivity was evaluated according to age groups. Results: A total of 86 children were included (54.7% girls), with a mean age of 7.7 ± 3.7 years (range: 1–17 years). Nickel was the most frequently detected allergen across all age groups. Formaldehyde resin, cl + me + isothiazolinone, and fragrance mix were the most common allergens in children aged 1–6 and 7–12 years. A patch test panel consisting of 14 allergens was sufficient to identify relevant sensitizations in all age groups. Conclusion: Standard patch test panels are often difficult to apply in children due to limited body surface area and practical constraints. Shortened, targeted patch test panels containing the most relevant allergens may improve diagnostic feasibility, particularly in pediatric patients and in settings with limited access to extensive allergen series.